IEEE C57.168-2023
IEEE Guide for Low-Frequency Dielectric Testing for Distribution, Power, and Regulating Transformers
| Fecha edición: |
2023-10-30
En Vigor
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| Idiomas disponibles: | Inglés |
| Keywords: | applied|auto-transformer|DFR|dielectric frequency response|dielectric test|IEEE C57.168 induced|insulation power factor|hi-pot|low-frequency test|over excitation|testing|transformer|transformers|troubleshooting |
| Scope: | New IEEE Standard - Active. Provided in this guide for low frequency dielectric testing for distribution, power, and regulating transformers are background on various low frequency test methods as well as guidance on how to conduct and interpret the results. Common pitfalls to avoid are presented along with compiled guidance on interpreting the results and possible methods for correcting test issues. |
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