DIN 50439:1982-10
Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
| Fecha edición: |
2008-02-01
Anulada
|
|---|---|
| Fecha cancelación: | 2008-02-01 |
| Idiomas disponibles: | Alemán |
| Keywords: | Definitions|Mercury switches|Profile|Semiconductor technology|Semiconductors|Silicon|Testing |
| ICS: | 29.045 - Materiales semiconductores |
| CTN: | |
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Reemplazo Normas |
Reemplaza a DIN 50439:1980-02 |










