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IEC
IEC 62429:2007
En Vigor
2007-11-30
Reliability growth - Stress testing for early failures in unique complex systems
IEC
IEC TR 60854:1986
En Vigor
1986-10-30
Methods of measuring the performance of ultrasonic pulse-echo diagnostic equipment
IEC
IEC 60748-11:1990
En Vigor
1990-12-20
Semiconductor devices - Integrated circuits - Part 11: Sectional
specification for semiconductor integrated circuits excluding hybrid circuits
IEC
IEC 60519-7:2008
En Vigor
2008-02-27
Safety in electroheat installations - Part 7: Particular requirements
for installations with electron guns










