AENOR Logo

Normas IEC

25239 Resultados disponibles

Filtrar:

(13703)
(11536)
IEC

IEC 60747-16-1:2001+AMD1:2007 CSV

En Vigor
2007-03-13
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
IEC

IEC 63169:2020+AMD1:2024 CSV

En Vigor
2024-12-03
Electrical household and similar cooling and freezing appliances - Food preservation
IEC

IEC 62755:2012+AMD1:2020 CSV

En Vigor
2020-07-09
Radiation protection instrumentation - Data format for radiation instruments used in the detection of illicit trafficking of radioactive materials
IEC

IEC 60061-3:1969/AMD21:1999

En Vigor
1999-02-23
Amendment 21 - Lamp caps and holders together with gauges for the control of interchangeability and safety. Part 3: Gauges
IEC

IEC 61291-6-1:2008

En Vigor
2008-08-13
Optical amplifiers - Part 6-1: Interfaces - Command set
IEC

IEC 61199:2011

En Vigor
2011-07-11
Single-capped fluorescent lamps - Safety specifications
IEC

IEC 60745-2-6:2003+AMD1:2006+AMD2:2008 CSV

En Vigor
2008-08-12
Hand-held motor-operated electric tools - Safety - Part 2-6: Particular requirements for hammers
IEC

IEC 60191-2:1966/AMD18:2011

En Vigor
2011-11-22
Amendment 18 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC

IEC 60404-4:1995+AMD1:2000+AMD2:2008 CSV

En Vigor
2008-11-13
Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials
IEC

IEC 60115-9-1:2003

En Vigor
2003-10-29
Fixed resistors for use in electronic equipment - Part 9-1: Blank detail specification: Fixed surface mount resistor networks with individually measurable resistors - Assessment level EZ
IEC

IEC 61512-3:2008

En Vigor
2008-07-08
Batch control - Part 3: General and site recipe models and representation
IEC

IEC 61290-3-1:2003

En Vigor
2003-08-26
Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
IEC

IEC 61158-6-9:2014

En Vigor
2014-08-19
Industrial communication networks - Fieldbus specifications - Part 6-9: Application layer protocol specification - Type 9 elements
IEC

CISPR 16-1-3:2004+AMD1:2016+AMD2:2020 CSV

En Vigor
2020-01-28
Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power
IEC

IEC 61508-4:2010

En Vigor
2010-04-30
Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 4: Definitions and abbreviations (see Functional Safety and IEC 61508)
IEC

IEC 61158-6-11:2007

En Vigor
2007-12-14
Industrial communication networks - Fieldbus specifications - Part 6-11: Application layer protocol specification - Type 11 elements
IEC

IEC 61146-3:1997

En Vigor
1997-07-03
Video cameras (PAL/SECAM/NTSC) - Methods of measurement - Part 3: Non-broadcast camera-recorders
IEC

IEC 61005:2014

En Vigor
2014-07-15
Radiation protection instrumentation - Neutron ambient dose equivalent (rate) meters
IEC

IEC TR 60877:1999

En Vigor
1999-01-07
Procedures for ensuring the cleanliness of industrial-process measurement and control equipment in oxygen service
IEC

IEC 62298-4:2005

En Vigor
2005-10-27
TeleWeb application - Part 4: Hyperteletext profile