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Normas IEC

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IEC

IEC TR 62221:2012

En Vigor
2012-12-12
Optical fibres - Measurement methods - Microbending sensitivity
 
IEC

IEC TR 62572-4:2020 RLV

En Vigor
2020-09-08
Fibre optic active components and devices - Reliability standards - Part 4: Guidelines for optical connector end-face cleaning methods for receptacle style optical transceivers
 
IEC

IEC TR 62461:2015

En Vigor
2015-01-23
Radiation protection instrumentation - Determination of uncertainty in measurement
 
IEC

IEC TS 62607-6-1:2020

En Vigor
2020-07-08
Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method
 
IEC

IEC 61671-6:2016

En Vigor
2016-04-08
Standard for automatic test markup language (ATML) test station description
 
IEC

IEC TS 60255-216-1:2025

En Vigor
2025-08-11
Measuring relays and protection equipment - Part 216-1: Digital interface - General requirements and tests for protection functions using digital communication as input and output
 
IEC

IEC 62931:2017

En Vigor
2017-01-25
GX16t-5 capped tubular LED lamp - Safety specifications
 
IEC

IEC 61499-2:2012

En Vigor
2012-11-07
Function blocks - Part 2: Software tool requirements
 
IEC

IEC 61169-23:2025

En Vigor
2025-08-27
Radio-frequency connectors - Part 23: Pin and socket connector for use with 3,5 mm rigid precision coaxial lines with inner diameter of outer conductor of 3,5 mm (0,1378 in)
 
IEC

IEC 61347-2-14:2018

En Vigor
2018-02-27
Lamp controlgear - Part 2-14: Particular requirements for DC and/or AC supplied electronic controlgear for fluorescent induction lamps
 
IEC

IEC TR 62354:2014

En Vigor
2014-09-25
General testing procedures for medical electrical equipment
 
IEC

IEC 62680-1-7:2019

En Vigor
2019-09-19
Universal serial bus interfaces for data and power - Part 1-7: Common components - USB Audio 3.0 device class definition data formats
 
IEC

IEC TS 63222-2:2023

En Vigor
2023-10-06
Power quality management - Part 2: Power quality monitoring system
 
IEC

IEC 63068-3:2020

En Vigor
2020-07-13
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
 
IEC

IEC 61340-2-3:2016

En Vigor
2016-06-23
Electrostatics - Part 2-3: Methods of test for determining the resistance and resistivity of solid materials used to avoid electrostatic charge accumulation
 
IEC

IEC TR 63122-1:2019

En Vigor
2019-12-11
Smart television - Part 1: Conceptual model for smart television
 
IEC

IEC 61557-1:2019+AMD1:2024 CSV

En Vigor
2024-10-15
Electrical safety in low voltage distribution systems up to 1 000 V AC and 1 500 V DC - Equipment for testing, measuring or monitoring of protective measures - Part 1: General requirements
 
IEC

IEC PAS 61980-5:2024

En Vigor
2024-12-12
Electric vehicle wireless power transfer (WPT) systems - Part 5: Interoperability and safety of dynamic wireless power transfer (D-WPT) for electric vehicles
 
IEC

IEC TS 62878-2-3:2015

En Vigor
2015-03-27
Device embedded substrate - Part 2-3: Guidelines - Design guide
 
IEC

IEC 61557-12:2018/AMD1:2021

En Vigor
2021-05-21
Amendment 1 - Electrical safety in low voltage distribution systems up to 1 000 V AC and 1 500 V DC - Equipment for testing, measuring or monitoring of protective measures - Part 12: Power metering and monitoring devices (PMD)