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Número de resultados: 267

DIN
Active
2024-06

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023 / Note: Date of issue 2024-05-03*Intended as replacement for DIN EN 60747-15 (2012-08).

DIN
Active
2024-04

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022 / Note: Date of issue 2024-03-08*Intended as replacement for DIN EN 60749-5 (2018-01).

DIN
Active
2023-12

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022 / Note: DIN EN 60749-37 (2008-08) remains valid alongside this standard until 2025-11-16.

DIN
Active
2023-12

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022 / Note: DIN EN 60749-10 (2003-04) remains valid alongside this standard until 2025-06-01.

DIN
Active
2023-10

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021 / Note: Date of issue 2023-09-29

DIN
Active
2023-09

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021 / Note: DIN EN 60749-43 (2018-05) remains valid alongside this standard until 2024-09-29.

DIN
Active
2023-07

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020 / Note: DIN EN 60749-20 (2010-04) remains valid alongside this standard until 2023-10-05.

DIN
Active
2023-03

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020

DIN
Active
2023-02

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020 / Note: DIN EN 60749-30 (2011-12) remains valid alongside this standard until 2023-09-21.

DIN
Active
2022-06

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021 / Note: Date of issue 2022-05-06

DIN
Active
2022-05

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2020); German version EN IEC 60749-15:2020 / Note: DIN EN 60749-15 (2011-06) remains valid alongside this standard until 2023-08-18.

DIN
Active
2020-02

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019 / Note: DIN EN 60749-18 (2003-09) remains valid alongside this standard until 2022-05-15.

Número de resultados: 267