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Buscador de normas

Buscador de normas

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Número de resultados: 86

UNE
Vigente
2006-11-01

Ensayo de estabilidad a temperatura Bias para óxido metálico, semiconductores, transistores de efecto de campo (IEC 62373:2006) (Ratificada por AENOR en noviembre de 2006).

IEC
VIGENTE
2022-05-11

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation

IEC
VIGENTE
2022-04-21

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors

IEC
VIGENTE
2022-04-21

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

IEC
VIGENTE
2021-08-24

Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method

IEC
VIGENTE
2021-06-25

Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

IEC
VIGENTE
2021-06-25

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

IEC
VIGENTE
2020-07-15

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

IEC
VIGENTE
2020-05-27

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

IEC
VIGENTE
2019-11-13

Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

IEC
VIGENTE
2019-09-23

Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

IEC
VIGENTE
2019-09-23

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

Número de resultados: 86