IEEE 641-1987
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
| Fecha edición: |
1992-12-03
Anulada
|
|---|---|
| Fecha cancelación: | 1992-12-03 |
| Idiomas disponibles: | Inglés |
| Keywords: | metal|nitrite|oxide|semiconductor|arrays |
| Scope: | New IEEE Standard - Inactive-Withdrawn. This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate. |
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