UNE-EN ISO 5436-1:2001
Especificación geométrica de productos (GPS). Calidad superficial: Método del perfil; patrones. Parte 1: Medidas materializadas. (ISO 5436-1:2000)
| Edition date: |
2001-04-30
In Force
|
|---|---|
| Confirmation date: | 2008-07-10 |
| Available languages: | Spanish, English |
| ICS: | 17.040.40-Geometrical Product Specification (GPS), 17.040.30-Measuring instruments |
| CTN: | CTN 82/SC 2 - Metrologia dimensional |
|
International Equivalence |
Identic EN ISO 5436-1:2000 Identic ISO 5436-1:2000 |










