UNE-EN 60749-19:2003/A1:2011
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 19: Resistencia de la pastilla al cizallamiento.
| Notice: | Standards that are modifications are not independent documents and must be obtained together with the standard they modify. |
|---|---|
| Edition date: |
2011-01-19
In Force
|
| Available languages: | Spanish, English |
| ICS: | 31.080.01-Semiconductor devices in general |
| CTN: | CTN 209/SC 47 - Dispositivos de semiconductores |
|
International Equivalence |
Identic EN 60749-19:2003/A1:2010 |
|
Modificaciones Normas |
Modifica a UNE-EN 60749-19:2003 |










