DIN 50451-7:2018-04
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
| Edition date: |
2018-04-01
In Force
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|---|---|
| Available languages: | German |
| Summary: | This document specifies methods of testing hydrochloric acid for small traces of 31 elements using the inductively coupled plasma mass spectrometry (ICP-MS). |
| Keywords: | Definitions|Elements|High-purity|Hydrochloric acid|ICP|Inductively Coupled Plasma|Liquids|Mass spectrometry|Materials testing|Samples|Sampling methods|Semiconductor technology|Semiconductors|Test performance|Testing|Trace elements |
| ICS: | 29.045-Semiconducting materials |
| CTN: | |
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Reemplazo Normas |
Reemplaza a DIN 50451-7:2017-09 |










