BS EN ISO 9220:2022
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
| Edition date: |
2022-07-26
In Force
|
|---|---|
| Available languages: | English |
| Summary: | This document specifies a destructive method for the measurement of
the local thickness of metallic and other inorganic coatings by
examination of cross-sections with a scanning electron microscope
(SEM). The method is applicable for thicknesses up to several
millimetres, but for such thick coatings it is usually more
practical to use a light microscope (see ISO 1463). The lower
thickness limit depends on the achieved measurement uncertainty
(see Clause 10). NOTE The method can also be used for organic
layers when they are neither damaged by the preparation of the
cross-section nor by the electron beam during imaging.
|
| ICS: | |
| CTN: | STI/33 - STI/33 |
|
International Equivalence |
Identic ISO 9220 |
|
Reemplazo Normas |
Reemplaza a BS EN ISO 9220:1995 |










