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BSI
21/30433862 DC
In Force
2021-04-28
BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method
for sputter rate determination in X-ray photoelectron spectroscopy,
Auger electron spectroscopy and secondary-ion mass spectrometry sputter
depth profiling using single and multi-layer thin films
BSI
19/30372027 DC
In Force
2019-02-07
BS ISO 9336-3. Optics and photonics. Optical transfer function.
Application. Part 3. Telescopes
BSI
23/30464119 DC
In Force
2023-01-18
BS ISO/IEC 18477-3. Information technology. Scalable compression and
coding of continuous-tone still images. Part 3. Box file format
BSI
BSI
BS 3338-21:1983
In Force
1983-10-31
Methods for the sampling and analysis of tin and tin alloys.
Determination of high cadmium content of soft solders
BSI
BS 3762-1:1983, ISO 607-1980
In Force
1983-12-30
Analysis of formulated detergents. Methods of sample division
BSI
20/30404139 DC
In Force
2020-04-21
BS EN ISO 29462. Field testing of general ventilation filtration devices
and systems for in situ removal efficiency by particle size and
resistance to airflow
BSI
12/30266553 DC
In Force
2012-09-12
BS EN 16477-2. Glass in building. Painted glass for internal use.
Evaluation of conformity










